HOME HELP FEEDBACK SUBSCRIPTIONS ARCHIVE SEARCH TABLE OF CONTENTS		QUICK SEARCH:   [advanced] Author: Keyword(s): Year:  Vol:  Page:

This Article Figures Only Full Text Full Text (PDF) Services Email this article to a friend Similar articles in this journal Alert me to new issues of the journal Download to citation manager Citing Articles Citing Articles via HighWire Citing Articles via ISI Web of Science (5) Citing Articles via Google Scholar Google Scholar Articles by Bernet, M. Articles by Bassett, K. Search for Related Content GeoRef GeoRef Citation

Provenance Analysis by Single-Quartz-Grain SEM-CL/Optical Microscopy

¹ Department of Geological Sciences, University of Canterbury, Private Bag 4800, Christchurch, New Zealand; present address: LGCA, Université Joseph Fourier, 38041 Grenoble Cedex 9, France; matthias.bernet{at}aya.yale.edu
² Department of Geological Sciences, University of Canterbury, Private Bag 4800, Christchurch, New Zealand

The integration of panchromatic scanning electron microscopy-cathodoluminescence (SEM-CL) with optical microscopy analysis on single quartz grains is a new technique to interpret provenance of quartz-rich sediments. The combination of information gained from SEM-CL on textural features and CL response with information from optical microscopy allows distinction of different quartz types much more easily then with conventional microscopy or color CL analysis. Features visible by SEM-CL include zoning, microcracks, deformation fractures and lamellae, diagenetic crushing, recrystallization, and strength and texture of CL response. Features visible by optical microscopy include embayments, open fractures, extinction behavior, and mono-, poly-, and microcrystallinity. The key is to integrate CL and optical properties of the same quartz grains in order to reduce ambiguities inherent in both techniques used on their own. Our technique is well suited for distinguishing between plutonic, volcanic, and metamorphic quartz in coarse- to medium-grained sand or sandstone. This simple and inexpensive approach can easily be combined with other provenance techniques. In this paper we outline the combined SEM-CL/optical microscopy technique and demonstrate its application with examples from the South Island of New Zealand.

This article has been cited by other articles:

				S. PATRANABIS-DEB, J. SCHIEBER, and A. BASU Almandine garnet phenocrysts in a ~ 1 Ga rhyolitic tuff from central India Geological Magazine, January 1, 2009; 146(1): 133 - 143. [Abstract] [Full Text] [PDF]

				H. R. Smyth, R. Hall, and G. J. Nichols Significant Volcanic Contribution to Some Quartz-Rich Sandstones, East Java, Indonesia Journal of Sedimentary Research, May 1, 2008; 78(5): 335 - 356. [Abstract] [Full Text] [PDF]